THICKNESS DEPENDENCE OF SIGNAL BACKGROUND RATIO OF INNER-SHELL ELECTRON-EXCITATION LOSS IN EELS

被引：7
作者：
HOSOI, J
OIKAWA, T
INOUE, M
KOKUBO, Y
机构：
来源：
ULTRAMICROSCOPY | 1984年 / 13卷 / 03期
关键词：
D O I：
10.1016/0304-3991(84)90211-0
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
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页码：329 / 332
页数：4
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