SELECTED AREA LOW-ENERGY ELECTRON-DIFFRACTION AND MICROSCOPY

被引：21
|
作者：
DELONG, A
KOLARIK, V
机构：
[1] Institute of Scientific Instruments, Czechoslovak Academy of Sciences, 612 64 Brno, Czechoslovakia
来源：
ULTRAMICROSCOPY | 1985年 / 17卷 / 01期
关键词：
ELECTRON LENSES - Design;
D O I：
10.1016/0304-3991(85)90178-0
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
The possibility of using the cathode lens for selected area low energy electron diffraction (LEED) and microscopy in selected reflection is discussed. The column design for separated primary and diffracted beams is described.
引用
收藏
页码：67 / 72
页数：6
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