RADIATION-DAMAGE OF GERMANIUM-DOPED SILICA GLASSES - SPECTRAL SIMPLIFICATION BY PHOTOBLEACHING AND THERMAL BLEACHING, SPECTRAL IDENTIFICATION AND MICROWAVE SATURATION CHARACTERISTICS

被引：6

作者：

CHAMULITRAT, W ^{[1
]}

KEVAN, L ^{[1
]}

SCHWARTZ, RN ^{[1
]}

BLAIR, GR ^{[1
]}

TANGONAN, GL ^{[1
]}

机构：

[1] HUGHES RES LABS,MALIBU,CA 90265

来源：

JOURNAL OF APPLIED PHYSICS | 1986年 / 59卷 / 08期

关键词：

D O I：

10.1063/1.336955

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：2933 / 2939

页数：7

共 19 条

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