HIGH-SPEED-RESPONSE INGAAS/INP HETEROSTRUCTURE AVALANCHE PHOTO-DIODE WITH INGAASP BUFFER LAYERS

被引:53
作者
MATSUSHIMA, Y
AKIBA, S
SAKAI, K
KUSHIRO, Y
NODA, Y
UTAKA, K
机构
关键词
D O I
10.1049/el:19820649
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
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页码:945 / 946
页数:2
相关论文
共 8 条
[1]  
AKIBA S, 1979, NATL CONV REC IECE J, P859
[2]   EXCESS-NOISE AND RECEIVER SENSITIVITY MEASUREMENTS OF IN0.53GA0.47AS-INP AVALANCHE PHOTO-DIODES [J].
FORREST, SR ;
WILLIAMS, GF ;
KIM, OK ;
SMITH, RG .
ELECTRONICS LETTERS, 1981, 17 (24) :917-919
[3]   OPTICAL-RESPONSE TIME OF IN0.53GA0.47AS/INP AVALANCHE PHOTO-DIODES [J].
FORREST, SR ;
KIM, OK ;
SMITH, RG .
APPLIED PHYSICS LETTERS, 1982, 41 (01) :95-98
[4]   A HIGH-GAIN IN0.53GA0.47AS-INP AVALANCHE PHOTO-DIODE WITH NO TUNNELING LEAKAGE CURRENT [J].
KIM, OK ;
FORREST, SR ;
BONNER, WA ;
SMITH, RG .
APPLIED PHYSICS LETTERS, 1981, 39 (05) :402-404
[5]  
Matsushima Y., 1980, Sixth European Conference on Optical Communication, P226
[6]  
MATSUSHIMA Y, 1981, IEEE ELECTRON DEVICE, V2, P179
[7]   NEW INGAAS-INP AVALANCHE PHOTO-DIODE STRUCTURE FOR THE 1-1.6 MU-M WAVELENGTH REGION [J].
SUSA, N ;
NAKAGOME, H ;
MIKAMI, O ;
ANDO, H ;
KANBE, H .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 1980, 16 (08) :864-870
[8]  
Yeats R., 1981, IEEE Electron Device Letters, VEDL-2, P268, DOI 10.1109/EDL.1981.25428