INFLUENCE OF SURFACE RECOMBINATION ON THE RATE OF ELECTRON LEAKAGE IN RIDGE-WAVEGUIDE INJECTION-LASERS

被引：3
|
作者：
WUNSCHE, HJ
WENZEL, H
机构：
来源：
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1989年 / 111卷 / 01期
关键词：
D O I：
10.1002/pssa.2211110141
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：377 / 386
页数：10
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