INFLUENCE OF SURFACE RECOMBINATION ON THE RATE OF ELECTRON LEAKAGE IN RIDGE-WAVEGUIDE INJECTION-LASERS

被引:3
|
作者
WUNSCHE, HJ
WENZEL, H
机构
来源
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1989年 / 111卷 / 01期
关键词
D O I
10.1002/pssa.2211110141
中图分类号
T [工业技术];
学科分类号
08 ;
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页码:377 / 386
页数:10
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