TEM METHODS FOR THE CHARACTERIZATION OF FINE METAL MULTILAYERS

被引：22

作者：

BAXTER, CS

STOBBS, WM

机构：

来源：

ULTRAMICROSCOPY | 1985年 / 16卷 / 02期

关键词：

D O I：

10.1016/0304-3991(85)90075-0

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：213 / 225

页数：13

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