THEORY OF THE LASER DIODE INTERACTION IN SCANNING FORCE MICROSCOPY

被引：7

作者：

SARID, D ^{[1
]}

WEISSENBERGER, V ^{[1
]}

IAMS, DA ^{[1
]}

INGLE, JT ^{[1
]}

机构：

[1] SIEMENS AG,ZFE TPH 15,D-8520 ERLANGEN,FED REP GER

来源：

IEEE JOURNAL OF QUANTUM ELECTRONICS | 1989年 / 25卷 / 08期

关键词：

D O I：

10.1109/3.34059

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1968 / 1972

页数：5

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