共 50 条
- [33] Ultrashallow p+-n junctions in Si(111): Electron-beam diagnostics of the surface region Semiconductors, 1999, 33 : 51 - 55
- [36] ELECTRON DOSE INDUCED VARIATIONS IN EBIC LINE SCAN PROFILES ACROSS SILICON P-N-JUNCTIONS INSTITUTE OF PHYSICS CONFERENCE SERIES, 1987, (87): : 721 - 726
- [37] Low energy scanning transmission electron beam induced current for nanoscale characterization of p-n junctions PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, 2017, 11 (01):
- [38] HYBRID METHOD FOR DETERMINATION OF PARAMETERS OF DEEP LEVELS IN P-N-JUNCTIONS SOVIET PHYSICS SEMICONDUCTORS-USSR, 1978, 12 (06): : 641 - 644