OPTIMUM EXPERIMENTAL CONDITIONS FOR QUANTITATIVE SURFACE MICROANALYSIS BY REFLECTION ELECTRON ENERGY-LOSS SPECTROSCOPY

被引:0
作者
WANG, ZL [1 ]
BENTLEY, J [1 ]
机构
[1] UNIV TENNESSEE,DEPT MAT SCI & ENGN,KNOXVILLE,TN 37996
来源
MICROSCOPY MICROANALYSIS MICROSTRUCTURES | 1991年 / 2卷 / 2-3期
关键词
D O I
暂无
中图分类号
TH742 [显微镜];
学科分类号
摘要
Experimental conditions for obtaining high quality core-shell ionization edges in reflection electron energy-loss spectroscopy (REELS) are investigated. Under the (600) specular "mirror" reflection conditions and using the relative ionization cross-section measured from a MgO thin foil in the transmission geometry for collection semi-angle beta = 1.2 mrad, the chemical composition of MgO (100) surfaces is determined to be N(O)/N(Mg) = 1.5 +/- 0.15. This value is not significantly affected by varying the resonance diffraction conditions near the [001] zone axis, under which the spectra were acquired. An incorrect apparent composition will result if channeling effects along the [011] zone axis are not considered properly. Surface microanalysis is limited by the accuracy of the core-shell effective ionization cross-section (EICS), which depends not only on the property of a single atom but also on the dynamical elastic and inelastic scattering and channeling processes of electrons. An experimental method is outlined by which to measure the relative EICS from a thin foil specimen in the transmission case under the equivalent resonance conditions as in reflection geometry.
引用
收藏
页码:301 / 314
页数:14
相关论文
共 50 条
[21]   ELECTRON ENERGY-LOSS SPECTROSCOPY [J].
WILLIAMS, BG .
PROGRESS IN SOLID STATE CHEMISTRY, 1987, 17 (02) :87-143
[22]   ELECTRON ENERGY-LOSS SPECTROSCOPY [J].
JOY, DC ;
MAHER, DM .
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1980, 13 (03) :260-270
[23]   Electron energy-loss spectroscopy [J].
Egerton, R .
PHYSICS WORLD, 1997, 10 (04) :47-51
[24]   SCANDIUM AND LUTETIUM SURFACES STUDIED BY REFLECTION ELECTRON ENERGY-LOSS SPECTROSCOPY [J].
ONSGAARD, J ;
TOUGAARD, S ;
MORGEN, P ;
RYBORG, F .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1980, 18 (1-2) :29-41
[25]   SLOW ELECTRON-ENERGY-LOSS SPECTROSCOPY FOR SURFACE MICROANALYSIS [J].
NASSIOPOULOS, AG ;
CAZAUX, J .
SURFACE SCIENCE, 1985, 149 (2-3) :313-325
[26]   INVESTIGATION OF THE SILICA SURFACE BY ELECTRON ENERGY-LOSS SPECTROSCOPY AND ELLIPSOMETRY [J].
BERMUDEZ, VM ;
RITZ, VH .
BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1979, 24 (03) :278-278
[27]   TRANSMISSION ELECTRON ENERGY-LOSS SPECTROSCOPY [J].
FINK, J .
TOPICS IN APPLIED PHYSICS, 1992, 69 :203-241
[28]   Electron energy-loss spectroscopy in the TEM [J].
Egerton, R. F. .
REPORTS ON PROGRESS IN PHYSICS, 2009, 72 (01)
[29]   Fundamentals of electron energy-loss spectroscopy [J].
Hofer, F. ;
Schmidt, F. P. ;
Grogger, W. ;
Kothleitner, G. .
14TH EUROPEAN WORKSHOP ON MODERN DEVELOPMENTS AND APPLICATIONS IN MICROBEAM ANALYSIS (EMAS 2015 WORKSHOP), 2016, 109
[30]   QUANTITATIVE-ANALYSIS OF SEMICONDUCTOR ALLOY COMPOSITION DURING GROWTH BY REFLECTION-ELECTRON ENERGY-LOSS SPECTROSCOPY [J].
NIKZAD, S ;
AHN, CC ;
ATWATER, HA .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1992, 10 (02) :762-765