Monitoring high-quality processes with one-sided conditional cumulative counts of conforming

被引:8
作者
Chiu, Jing-Er [1 ]
Tsai, Chih-Hsin [2 ]
机构
[1] Natl Yunlin Univ Sci & Technol, Dept Ind Engn & Management, Touliu 64002, Yunlin, Taiwan
[2] Natl Hlth Res Inst, Nat Environm Hlth Res Ctr, Miaoli 35053, Taiwan
关键词
one-sided design; cumulative count of conforming (CCC) chart; high-quality process; average run length (ARL); geometric distribution;
D O I
10.1080/21681015.2015.1091389
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Due to the development of high-quality manufacturing processes, a cumulative count of conforming (CCC) chart has been demonstrated to be useful in high-quality manufacturing processes for monitoring the nonconforming fraction. When the quality characteristic is asymmetric and the one-directional shifting is of interest, a one-sided control chart is more appropriate than a two-sided chart. We construct a one-sided CCC chart for high-quality processes based on previous runs to improve its sensitivity. The results show that the proposed conditional procedure method of the one-sided CCC chart can detect the shift quickly when the process begins to deteriorate at the beginning. A real case example of medication error is illustrated using the proposed charting technique. It shows that the proposed method is more suitable than traditional p-chart. The proposed conditional one-sided CCC procedure is useful in manufacturing that involves high-quality processes.
引用
收藏
页码:559 / 565
页数:7
相关论文
共 24 条
[1]   Estimating the change point of the cumulative count of a conforming control chart under a drift [J].
Amiri, Amirhossein ;
Khosravi, Ramezan .
SCIENTIA IRANICA, 2012, 19 (03) :856-861
[3]   QUALITY-CONTROL TECHNIQUES FOR ZERO DEFECTS [J].
CALVIN, TW .
IEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY, 1983, 6 (03) :323-328
[4]   A two-stage decision procedure for monitoring processes with low fraction nonconforming [J].
Chan, LY ;
Lai, CD ;
Xie, M ;
Goh, TN .
EUROPEAN JOURNAL OF OPERATIONAL RESEARCH, 2003, 150 (02) :420-436
[5]   Design of cumulative count of conforming charts for high yield processes based on average number of items inspected [J].
Chen, Jung-Tai .
INTERNATIONAL JOURNAL OF QUALITY & RELIABILITY MANAGEMENT, 2013, 30 (09) :942-+
[6]  
Chen Y. K., 2010, APPL STOCH MODEL D A, V27, P410
[7]   ONLINE G-CONTROL CHART FOR ATTRIBUTE DATA [J].
GLUSHKOVSKY, EA .
QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL, 1994, 10 (03) :217-227
[8]  
Goh T. N., 1987, Quality Assurance, V13, P18
[9]   STATISTICAL CONTROL CHARTS BASED ON A GEOMETRIC DISTRIBUTION [J].
KAMINSKY, FC ;
BENNEYAN, JC ;
DAVIS, RD ;
BURKE, RJ .
JOURNAL OF QUALITY TECHNOLOGY, 1992, 24 (02) :63-69
[10]   A conditional decision procedure for high yield processes [J].
Kuralmani, V ;
Xie, M ;
Goh, TN ;
Gan, FF .
IIE TRANSACTIONS, 2002, 34 (12) :1021-1030