CHARACTERIZATION OF STOICHIOMETRY IN GAAS BY X-RAY-INTENSITY MEASUREMENTS OF QUASI-FORBIDDEN REFLECTIONS

被引：56

作者：

FUJIMOTO, I

机构：

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 1984年 / 23卷 / 05期

关键词：

D O I：

10.1143/JJAP.23.L287

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：L287 / L289

页数：3

共 16 条

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