HOLOGRAPHIC MOIRE DEFLECTOMETRY - A METHOD FOR STIFF DENSITY FIELDS ANALYSIS

被引：6

作者：

STRICKER, J

POLITCH, J

机构：

来源：

APPLIED PHYSICS LETTERS | 1984年 / 44卷 / 08期

关键词：

D O I：

10.1063/1.94922

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

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页码：723 / 725

页数：3

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