MICROWAVE CAVITY-PERTURBATION EQUATIONS IN SKIN-DEPTH REGIME

被引:50
|
作者
ONG, NP [1 ]
机构
[1] UNIV CALIF BERKELEY,DEPT PHYS,BERKELEY,CA 94720
关键词
D O I
10.1063/1.324105
中图分类号
O59 [应用物理学];
学科分类号
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页码:2935 / 2940
页数:6
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