NON-DESTRUCTIVE DETERMINATION OF COMPOSITION AND THICKNESS OF MULTICOMPONENT ALLOY THIN-FILMS BY X-RAY-FLUORESCENCE SPECTROSCOPIC METHOD

被引：0

作者：

CHENG, JB ^{[1
]}

CHENG, WR ^{[1
]}

WANG, XH ^{[1
]}

HAO, GZ ^{[1
]}

WU, ZC ^{[1
]}

机构：

[1] MINIST MET INST,GEN INST NONFERROUS MET,BEIJING,PEOPLES R CHINA

来源：

CHINESE PHYSICS | 1983年 / 3卷 / 03期

关键词：

D O I：

暂无

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：606 / 610

页数：5

共 10 条

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[8]

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[9] X-RAY-FLUORESCENCE ANALYSIS WITHOUT STANDARDS OF SMALL PARTICLES EXTRACTED FROM SUPER-ALLOYS [J].

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X-RAY SPECTROMETRY, 1980, 9 (03) :138-142

[10] SECONDARY EXCITATION IN XRAY FLUORESCENCE ANALYSIS OF THIN PLANAR FILMS [J].

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