HIGH-RESOLUTION ELECTRON-MICROSCOPY

被引：0
|
作者：
HASHIMOTO, H [1 ]
机构：
[1] OSAKA UNIV,DIV ENGN,DEPT APPL PHYS,SUITA,OSAKA 565,JAPAN
来源：
ULTRAMICROSCOPY | 1984年 / 12卷 / 1-2期
关键词：
D O I：
暂无
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
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页码：90 / 90
页数：1
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