HIGH-RESOLUTION ELECTRON-MICROSCOPY

被引：0

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作者：

HASHIMOTO, H ^{[1
]}

机构：

[1] OSAKA UNIV,DIV ENGN,DEPT APPL PHYS,SUITA,OSAKA 565,JAPAN

来源：

ULTRAMICROSCOPY | 1984年 / 12卷 / 1-2期

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中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

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页码：90 / 90

页数：1

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