HIGH DOPING OF PHOSPHORUS IN SI USING GAS SOURCE MOLECULAR-BEAM EPITAXY

被引:32
作者
HIRAYAMA, H
TATSUMI, T
机构
关键词
D O I
10.1063/1.102122
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:131 / 133
页数:3
相关论文
共 10 条
[1]   SILICON MOLECULAR-BEAM EPITAXY - 1984-1986 [J].
BEAN, JC .
JOURNAL OF CRYSTAL GROWTH, 1987, 81 (1-4) :411-420
[2]   DISILANE GAS SOURCE SI-MBE [J].
HIRAYAMA, H ;
TATSUMI, T ;
AIZAKI, N .
JOURNAL OF CRYSTAL GROWTH, 1989, 95 (1-4) :476-479
[3]   GAS SOURCE SILICON MOLECULAR-BEAM EPITAXY USING DISILANE [J].
HIRAYAMA, H ;
TATSUMI, T ;
AIZAKI, N .
APPLIED PHYSICS LETTERS, 1988, 52 (18) :1484-1486
[4]   GAS SOURCE SILICON MOLECULAR-BEAM EPITAXY USING SILANE [J].
HIRAYAMA, H ;
TATSUMI, T ;
OGURA, A ;
AIZAKI, N .
APPLIED PHYSICS LETTERS, 1987, 51 (26) :2213-2215
[5]   SELECTIVE GROWTH CONDITION IN DISILANE GAS SOURCE SILICON MOLECULAR-BEAM EPITAXY [J].
HIRAYAMA, H ;
TATSUMI, T ;
AIZAKI, N .
APPLIED PHYSICS LETTERS, 1988, 52 (26) :2242-2243
[6]  
HIRAYAMA H, UNPUB
[7]   PHOSPHORUS-DOPED POLYCRYSTALLINE SILICON VIA LPCVD .2. SURFACE INTERACTIONS OF THE SILANE PHOSPHINE SILICON SYSTEM [J].
MEYERSON, BS ;
YU, ML .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1984, 131 (10) :2366-2368
[8]   PHOSPHORUS-DOPED POLYCRYSTALLINE SILICON VIA LPCVD .1. PROCESS CHARACTERIZATION [J].
MEYERSON, BS ;
OLBRICHT, W .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1984, 131 (10) :2361-2365
[9]  
OHTA Y, 1983, THIN SOLID FILMS, V106, P3
[10]  
SZE SM, 1981, PHYSICS SEMICONDUCTO