EFFECT OF NEUTRON-INDUCED DEFECTS ON THE CURRENT-CARRYING BEHAVIOR OF NIOBIUM STANNIDE

被引:0
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作者
CULLEN, GW
NOVAK, RL
MCEVOY, JP
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RCA REVIEW | 1964年 / 25卷 / 03期
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TM [电工技术]; TN [电子技术、通信技术];
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0808 ; 0809 ;
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页码:479 / 490
页数:12
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