ACCURATE MEASUREMENT OF REFLECTIVITY OVER WAVELENGTH OF A LASER-DIODE ANTIREFLECTION COATING USING AN EXTERNAL-CAVITY LASER

被引:6
作者
STOKES, LF
机构
[1] Hewlett-Packard Lightwave Operation., Santa Rosa
关键词
D O I
10.1109/50.238077
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A method to measure laser diode facet antireflection coating over wavelength is presented. The laser diode is coupled to a wavelength-selective external cavity, and laser threshold current over the wavelength region of interest is measured. The coating reflectivity over wavelength is derived from the threshold current data. Reflectivities as low as 1 x 10(-5) have been measured with good fit over wavelength to an ideal single layer coating. In addition, the net external cavity feedback is also determined. An estimate of the accuracy of the reflectivity measurement is made.
引用
收藏
页码:1162 / 1167
页数:6
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