DISLOCATIONS AS THE ORIGIN OF THRESHOLD VOLTAGE SCATTERINGS FOR GAAS-MESFET ON LEC-GROWN SEMI-INSULATING GAAS SUBSTRATE

被引:26
作者
MIYAZAWA, S
ISHII, Y
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D O I
10.1109/T-ED.1984.21660
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
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页码:1057 / 1062
页数:6
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共 26 条
[21]   INHOMOGENEOUS GAAS-FET THRESHOLD VOLTAGES RELATED TO DISLOCATION DISTRIBUTION [J].
NANISHI, Y ;
ISHIDA, S ;
HONDA, T ;
YAMAZAKI, H ;
MIYAZAWA, S .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1982, 21 (06) :L335-L337
[22]   Cathodoluminescent Studies of Laser Quality GaAs [J].
Shaw, D. A. ;
Thornton, P. R. .
JOURNAL OF MATERIALS SCIENCE, 1968, 3 (05) :507-518
[23]   CHARACTERIZATION OF ELECTRON TRAPS IN ION-IMPLANTED GAAS-MESFETS ON UNDOPED AND CR-DOPED LEC SEMI-INSULATING SUBSTRATES [J].
SRIRAM, S ;
DAS, MB .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1983, 30 (06) :586-592
[24]  
STENKENBORN A, 1981, J LUMINESCENCE 1, V24, P351
[25]   CHARACTERIZATION OF DEEP LEVELS IN LEC GAAS CRYSTALS BY THE PHOTO-LUMINESCENCE TECHNIQUE [J].
TAJIMA, M ;
OKADA, Y .
PHYSICA B & C, 1983, 116 (1-3) :404-408
[26]   LOW-DOSE SI ION-IMPLANTATION INTO SEMI-INSULATING LEC GAAS [J].
YAMAZAKI, H ;
HONDA, T ;
MIYAZAWA, S .
ELECTRONICS LETTERS, 1981, 17 (21) :817-819