SIMPLIFIED METHOD FOR DETERMINATION OF INDUCED-EMISSION CROSS-SECTION OF NEODYMIUM DOPED GLASSES

被引：6
作者：
DEUTSCHBEIN, OKF
机构：
来源：
IEEE JOURNAL OF QUANTUM ELECTRONICS | 1976年 / 12卷 / 09期
关键词：
D O I：
10.1109/JQE.1976.1069208
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
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页码：551 / 554
页数：4
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