MATERIAL CONSUMPTION IN THE ANALYSIS OF METALS BY SPARK SOURCE-MASS SPECTROMETRY

被引：7
作者：
VERLINDEN, J
VANPUYMBROECK, J
GIJBELS, R
机构：
来源：
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES | 1983年 / 47卷 / JAN期
关键词：
D O I：
10.1016/0020-7381(83)87191-5
中图分类号：
O64 [物理化学（理论化学）、化学物理学]; O56 [分子物理学、原子物理学];
学科分类号：
070203 ; 070304 ; 081704 ; 1406 ;
摘要：
引用
收藏
页码：287 / 290
页数：4
相关论文
共 5 条
[1]   ANALYSIS OF THIN-FILMS BY SSMS - MORE DETAILED DISCHARGE MODEL AND RECENT EXPERIMENTS [J].
DERZHIEV, VI ;
RAMENDIK, GI ;
LIEBICH, V ;
MAI, H .
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY, 1980, 32 (04) :345-361
[2]  
GERMAIN C, 6TH P INT C ION PHEN, V2, P111
[3]   INFLUENCE OF MATRIX ON RELATIVE SENSITIVITY FACTORS IN SPARK-SOURCE MASS-SPECTROMETRIC ANALYSIS [J].
ITO, M ;
SATO, S ;
YANAGIHARA, K .
ANALYTICA CHIMICA ACTA, 1980, 120 (NOV) :217-226
[4]  
SLIVKOV IN, 1972, ELECTRIC INSULATION
[5]   INFLUENCE OF SPARKING CONDITIONS AND OF ELECTRODE TEMPERATURE ON THE RELATIVE ELEMENTAL SENSITIVITY IN SPARK-SOURCE MASS-SPECTROMETRY [J].
VANHOYE, E ;
ADAMS, F ;
GIJBELS, R .
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1979, 30 (01) :75-81
1