Sampling Plans Based on Truncated Life Test for a Generalized Inverted Exponential Distribution

被引：23

作者：

Singh, Sukhdev ^{[1
]}

Tripathi, Yogesh Mani ^{[1
]}

Jun, Chi-Hyuck ^{[2
]}

机构：

[1] Indian Inst Technol, Dept Math, Patna 800013, Bihar, India

[2] Pohang Univ Sci & Technol, Dept Ind & Management Engn, Pohang, South Korea

来源：

INDUSTRIAL ENGINEERING AND MANAGEMENT SYSTEMS | 2015年 / 14卷 / 02期

关键词：

Consumer's Risk; Double Acceptance Sampling Plan; Group Acceptance Sampling Plan; Producer's Risk; Single Acceptance Sampling Plan; Truncated Life Test; Two-Stage Group Acceptance Sampling Plan;

D O I：

10.7232/iems.2015.14.2.183

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

In this paper, we propose a two-stage group acceptance sampling plan for generalized inverted exponential distribution under truncated life test. Median life is considered as a quality parameter. Design parameters are obtained to ensure that true median life is longer than a given specified life at certain level of consumer's risk and producer's risk. We also explore situations under which design parameters based on median lifetime can be used for other percentile points. Tables and specific examples are reported to explain the proposed plans. Finally a real data set is analyzed to implement the plans in practical situations and some suggestions are given.

引用

页码：183 / 195

页数：13

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