HIGH-RESOLUTION MAGNETIC FORCE MICROSCOPY

被引：0

作者：

GRUTTER, P

WADAS, A

MEYER, E

HEINZELMANN, H

HIDBER, HR

GUNTHERODT, HJ

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1990年 / 67卷 / 09期

关键词：

D O I：

暂无

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：5953 / 5953

页数：1

共 7 条

[1]

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[2]

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[3]

GRUTTER P, 1990, J VAC SCI TECHNOL A, V8, P406, DOI 10.1116/1.576408

[4]

GRUTTER P, 1988, J VAC SCI TECHNOL A, V6, P279, DOI 10.1116/1.575425

[5] MAGNETIC IMAGING BY FORCE MICROSCOPY WITH 1000-A RESOLUTION [J].

MARTIN, Y ;

WICKRAMASINGHE, HK .

APPLIED PHYSICS LETTERS, 1987, 50 (20) :1455-1457

[6] OBSERVATION OF MAGNETIC FORCES BY THE ATOMIC FORCE MICROSCOPE [J].

SAENZ, JJ ;

GARCIA, N ;

GRUTTER, P ;

MEYER, E ;

HEINZELMANN, H ;

WIESENDANGER, R ;

ROSENTHALER, L ;

HIDBER, HR ;

GUNTERODT, HJ .

JOURNAL OF APPLIED PHYSICS, 1987, 62 (10) :4293-4295

[7] THEORETICAL APPROACH TO MAGNETIC FORCE MICROSCOPY [J].

WADAS, A ;

GRUTTER, P .

PHYSICAL REVIEW B, 1989, 39 (16) :12013-12017

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