首页
学术期刊
论文检测
AIGC检测
热点
更多
数据
ELECTROCHEMICAL AND PHOTOELECTROCHEMICAL BEHAVIOR OF N-GAAS AND P-GAAS IN THE PRESENCE OF H2O2
被引:19
|
作者
:
BADAWY, WA
论文数:
0
引用数:
0
h-index:
0
机构:
FREE UNIV BERLIN, INST PHYS CHEM, W-1000 BERLIN 33, GERMANY
FREE UNIV BERLIN, INST PHYS CHEM, W-1000 BERLIN 33, GERMANY
BADAWY, WA
[
1
]
PFUHL, G
论文数:
0
引用数:
0
h-index:
0
机构:
FREE UNIV BERLIN, INST PHYS CHEM, W-1000 BERLIN 33, GERMANY
FREE UNIV BERLIN, INST PHYS CHEM, W-1000 BERLIN 33, GERMANY
PFUHL, G
[
1
]
PLIETH, WJ
论文数:
0
引用数:
0
h-index:
0
机构:
FREE UNIV BERLIN, INST PHYS CHEM, W-1000 BERLIN 33, GERMANY
FREE UNIV BERLIN, INST PHYS CHEM, W-1000 BERLIN 33, GERMANY
PLIETH, WJ
[
1
]
机构
:
[1]
FREE UNIV BERLIN, INST PHYS CHEM, W-1000 BERLIN 33, GERMANY
来源
:
JOURNAL OF THE ELECTROCHEMICAL SOCIETY
|
1990年
/ 137卷
/ 02期
关键词
:
D O I
:
10.1149/1.2086493
中图分类号
:
O646 [电化学、电解、磁化学];
学科分类号
:
081704 ;
摘要
:
The electrochemical and photoelectrochemical behavior of surfaces of (100) n-GaAs and p-GaAs were studied in acid and alkaline solutions containing H2O2. Hydrogen peroxide shifted the flatband potential of p-GaAs, while it did not affect that of n-GaAs. The direction of the shift depended on the pH of the electrolyte: cathodically in acid and anodically in alkaline solution. The reduction of H2O2 in the dark and under illumination was studied by dark current and by photocurrent potential measurements. A mechanism for the decomposition of GaAs at the electrode/electrolyte interface was formulated. © 1990, The Electrochemical Society, Inc. All rights reserved.
引用
收藏
页码:531 / 537
页数:7
相关论文
共 50 条
[1]
PHOTOELECTROCHEMICAL BEHAVIOR OF SEMICONDUCTING N-GAAS AND P-GAAS AND INP ELECTRODES IN ACETONITRILE SOLUTIONS
不详
论文数:
0
引用数:
0
h-index:
0
不详
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1978,
125
(07)
: C283
-
C283
[2]
PHOTOELECTROCHEMICAL PROPERTIES OF N-GAAS COATED WITH P-GAAS EPITAXIAL LAYER BY MBE
SUZUKI, T
论文数:
0
引用数:
0
h-index:
0
机构:
NIPPON INST TECHNOL,DEPT SYST ENGN,SAITAMA 345,JAPAN
NIPPON INST TECHNOL,DEPT SYST ENGN,SAITAMA 345,JAPAN
SUZUKI, T
论文数:
引用数:
h-index:
机构:
IIZUKA, K
MIZUTANI, F
论文数:
0
引用数:
0
h-index:
0
机构:
NIPPON INST TECHNOL,DEPT SYST ENGN,SAITAMA 345,JAPAN
NIPPON INST TECHNOL,DEPT SYST ENGN,SAITAMA 345,JAPAN
MIZUTANI, F
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1987,
134
(8B)
: C465
-
C465
[3]
SHALLOW OHMIC CONTACT TO BOTH N-GAAS AND P-GAAS
HAN, WY
论文数:
0
引用数:
0
h-index:
0
机构:
USA, ELECTR TECHNOL & DEVICE LAB, FT MONMOUTH, NJ 07703 USA
HAN, WY
LU, Y
论文数:
0
引用数:
0
h-index:
0
机构:
USA, ELECTR TECHNOL & DEVICE LAB, FT MONMOUTH, NJ 07703 USA
LU, Y
LEE, HS
论文数:
0
引用数:
0
h-index:
0
机构:
USA, ELECTR TECHNOL & DEVICE LAB, FT MONMOUTH, NJ 07703 USA
LEE, HS
COLE, MW
论文数:
0
引用数:
0
h-index:
0
机构:
USA, ELECTR TECHNOL & DEVICE LAB, FT MONMOUTH, NJ 07703 USA
COLE, MW
CASAS, LM
论文数:
0
引用数:
0
h-index:
0
机构:
USA, ELECTR TECHNOL & DEVICE LAB, FT MONMOUTH, NJ 07703 USA
CASAS, LM
DEANNI, A
论文数:
0
引用数:
0
h-index:
0
机构:
USA, ELECTR TECHNOL & DEVICE LAB, FT MONMOUTH, NJ 07703 USA
DEANNI, A
JONES, KA
论文数:
0
引用数:
0
h-index:
0
机构:
USA, ELECTR TECHNOL & DEVICE LAB, FT MONMOUTH, NJ 07703 USA
JONES, KA
YANG, LW
论文数:
0
引用数:
0
h-index:
0
机构:
USA, ELECTR TECHNOL & DEVICE LAB, FT MONMOUTH, NJ 07703 USA
YANG, LW
JOURNAL OF APPLIED PHYSICS,
1993,
74
(01)
: 754
-
756
[4]
PHOTOSENSITIVITY OF THE EPITAXIAL STRUCTURE P-GAAS/N-GAAS/P-SI
IVANYUTIN, LA
论文数:
0
引用数:
0
h-index:
0
IVANYUTIN, LA
KATSAPOV, FM
论文数:
0
引用数:
0
h-index:
0
KATSAPOV, FM
RAKHLEI, SY
论文数:
0
引用数:
0
h-index:
0
RAKHLEI, SY
TSYPLENKOV, IN
论文数:
0
引用数:
0
h-index:
0
TSYPLENKOV, IN
SEMICONDUCTORS,
1995,
29
(10)
: 914
-
916
[5]
NEAR-FLAT-BAND N-GAAS AND P-GAAS IN AIR
KIRCHNER, PD
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
KIRCHNER, PD
WOODALL, JM
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
WOODALL, JM
PETTIT, GD
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
PETTIT, GD
WARREN, AC
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
WARREN, AC
WRIGHT, SL
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
WRIGHT, SL
TSANG, JC
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
TSANG, JC
FREEOUF, JL
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
FREEOUF, JL
BAKER, JM
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
BAKER, JM
JOURNAL OF ELECTRONIC MATERIALS,
1986,
15
(05)
: 311
-
312
[6]
PHOTOELECTROCHEMICAL BEHAVIOR OF N-GAAS WITH COBALT FILMS
AHMED, SM
论文数:
0
引用数:
0
h-index:
0
机构:
ENERGY MINES & RESOURCES CANADA,CANMET,OTTAWA,ONTARIO,CANADA
ENERGY MINES & RESOURCES CANADA,CANMET,OTTAWA,ONTARIO,CANADA
AHMED, SM
LEDUC, J
论文数:
0
引用数:
0
h-index:
0
机构:
ENERGY MINES & RESOURCES CANADA,CANMET,OTTAWA,ONTARIO,CANADA
ENERGY MINES & RESOURCES CANADA,CANMET,OTTAWA,ONTARIO,CANADA
LEDUC, J
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1985,
132
(08)
: C361
-
C361
[7]
Resonant tunneling as a dominant transport mechanism in n-GaAs/p-GaAs tunnel diodes
Jandieri, K.
论文数:
0
引用数:
0
h-index:
0
机构:
Philipps Univ Marburg, Dept Phys, D-35032 Marburg, Germany
Philipps Univ Marburg, Ctr Mat Sci, D-35032 Marburg, Germany
Philipps Univ Marburg, Dept Phys, D-35032 Marburg, Germany
Jandieri, K.
Baranovskii, S. D.
论文数:
0
引用数:
0
h-index:
0
机构:
Philipps Univ Marburg, Dept Phys, D-35032 Marburg, Germany
Philipps Univ Marburg, Ctr Mat Sci, D-35032 Marburg, Germany
Philipps Univ Marburg, Dept Phys, D-35032 Marburg, Germany
Baranovskii, S. D.
Rubel, O.
论文数:
0
引用数:
0
h-index:
0
机构:
Philipps Univ Marburg, Dept Phys, D-35032 Marburg, Germany
Philipps Univ Marburg, Ctr Mat Sci, D-35032 Marburg, Germany
Philipps Univ Marburg, Dept Phys, D-35032 Marburg, Germany
Rubel, O.
Stolz, W.
论文数:
0
引用数:
0
h-index:
0
机构:
Philipps Univ Marburg, Dept Phys, D-35032 Marburg, Germany
Philipps Univ Marburg, Ctr Mat Sci, D-35032 Marburg, Germany
Philipps Univ Marburg, Dept Phys, D-35032 Marburg, Germany
Stolz, W.
Gebhard, F.
论文数:
0
引用数:
0
h-index:
0
机构:
Philipps Univ Marburg, Dept Phys, D-35032 Marburg, Germany
Philipps Univ Marburg, Ctr Mat Sci, D-35032 Marburg, Germany
Philipps Univ Marburg, Dept Phys, D-35032 Marburg, Germany
Gebhard, F.
Guter, W.
论文数:
0
引用数:
0
h-index:
0
机构:
Fraunhofer Inst Solar Energy Syst, D-79110 Freiburg, Germany
Philipps Univ Marburg, Dept Phys, D-35032 Marburg, Germany
Guter, W.
Hermle, M.
论文数:
0
引用数:
0
h-index:
0
机构:
Fraunhofer Inst Solar Energy Syst, D-79110 Freiburg, Germany
Philipps Univ Marburg, Dept Phys, D-35032 Marburg, Germany
Hermle, M.
Bett, A. W.
论文数:
0
引用数:
0
h-index:
0
机构:
Fraunhofer Inst Solar Energy Syst, D-79110 Freiburg, Germany
Philipps Univ Marburg, Dept Phys, D-35032 Marburg, Germany
Bett, A. W.
APPLIED PHYSICS LETTERS,
2008,
92
(24)
[8]
NEAR BALLISTIC TRANSPORT IN A NONPARABOLIC-BAND STRUCTURE FOR N-GAAS AND P-GAAS
LEE, J
论文数:
0
引用数:
0
h-index:
0
LEE, J
SU, CB
论文数:
0
引用数:
0
h-index:
0
SU, CB
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1982,
29
(05)
: 933
-
935
[9]
Current imaging tunneling spectroscopy of thin n-GaAs/p-GaAs multilayer structures in air
Kato, Takashi
论文数:
0
引用数:
0
h-index:
0
机构:
Optoelectronics Technology Research, Lab, Ibaraki, Japan
Optoelectronics Technology Research, Lab, Ibaraki, Japan
Kato, Takashi
Tanaka, Ichiro
论文数:
0
引用数:
0
h-index:
0
机构:
Optoelectronics Technology Research, Lab, Ibaraki, Japan
Optoelectronics Technology Research, Lab, Ibaraki, Japan
Tanaka, Ichiro
Sugiyama, Nao-haru
论文数:
0
引用数:
0
h-index:
0
机构:
Optoelectronics Technology Research, Lab, Ibaraki, Japan
Optoelectronics Technology Research, Lab, Ibaraki, Japan
Sugiyama, Nao-haru
Osaka, Fukunobu
论文数:
0
引用数:
0
h-index:
0
机构:
Optoelectronics Technology Research, Lab, Ibaraki, Japan
Optoelectronics Technology Research, Lab, Ibaraki, Japan
Osaka, Fukunobu
Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers,
1990,
29
(07):
: 1188
-
1191
[10]
SPUTTER-INDUCED DAMAGE IN AL/N-GAAS AND AL/P-GAAS SCHOTTKY BARRIERS
VANDENBROUCKE, DA
论文数:
0
引用数:
0
h-index:
0
VANDENBROUCKE, DA
VANMEIRHAEGHE, RL
论文数:
0
引用数:
0
h-index:
0
VANMEIRHAEGHE, RL
LAFLERE, WH
论文数:
0
引用数:
0
h-index:
0
LAFLERE, WH
CARDON, F
论文数:
0
引用数:
0
h-index:
0
CARDON, F
SEMICONDUCTOR SCIENCE AND TECHNOLOGY,
1987,
2
(05)
: 293
-
298
←
1
2
3
4
5
→