THE PREPARATION OF CROSS-SECTION SPECIMENS FOR TRANSMISSION ELECTRON-MICROSCOPY

被引:382
作者
BRAVMAN, JC
SINCLAIR, R
机构
来源
JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE | 1984年 / 1卷 / 01期
关键词
D O I
10.1002/jemt.1060010106
中图分类号
Q [生物科学];
学科分类号
07 ; 0710 ; 09 ;
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页码:53 / 61
页数:9
相关论文
共 3 条
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[2]   TRANSMISSION ELECTRON-MICROSCOPY STUDIES OF THE POLYCRYSTALLINE SILICON-SIO2 INTERFACE [J].
BRAVMAN, JC ;
SINCLAIR, R .
THIN SOLID FILMS, 1983, 104 (1-2) :153-161
[3]   ADVANCES IN TRANSMISSION ELECTRON-MICROSCOPE TECHNIQUES APPLIED TO DEVICE FAILURE ANALYSIS [J].
SHENG, TT ;
MARCUS, RB .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1980, 127 (03) :737-743