MOIRE PROFILE PREDICTION BY USING FOURIER-SERIES FORMALISM

被引：36

作者：

PATORSKI, K ^{[1
]}

YOKOZEKI, S ^{[1
]}

SUZUKI, T ^{[1
]}

机构：

[1] OSAKA UNIV,FAC ENGN,DEPT APPL PHYS,SUITA,OSAKA,JAPAN

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS | 1976年 / 15卷 / 03期

关键词：

D O I：

10.1143/JJAP.15.443

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：443 / 456

页数：14

共 17 条

[1] REMOVAL OF UNWANTED PATTERNS FROM MOIRE CONTOUR MAPS BY GRID TRANSLATION TECHNIQUES [J].

ALLEN, JB ;

MEADOWS, DM .

APPLIED OPTICS, 1971, 10 (01) :210-&

[2] MOIRE AND HIGHER GRATING HARMONICS [J].

BRYNGDAHL, O .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1975, 65 (06) :685-694

[3]

BURCH JM, 1963, PROGRESS OPTICS, V2, P75

[4]

DURELLI AJ, 1970, MOIRE ANALYSIS STRAI

[5]

Ebbeni J., 1970, NOUV REV OPT APPL, V1, P333, DOI [10.1088/0029-4780/1/5/308, DOI 10.1088/0029-4780/1/5/308]

[6]

Guild J., 1956, INTERFERENCE SYSTEMS

[7] FOURIER-SERIES APPROACH TO MOIRE PATTERNS WITH SPECIAL REFERENCE TO THOSE PRODUCED BY OVERLAPPING ZONE PLATES [J].

HARBURN, G ;

WELBERRY, TR ;

WILLIAMS, RP .

OPTICA ACTA, 1975, 22 (05) :409-420

[8]

LANGENBECK P, 1969, APPL OPTICS, V8, P543

[9] VARIABLE FRESNEL ZONE PATTERN [J].

LOHMANN, AW ;

PARIS, DP .

APPLIED OPTICS, 1967, 6 (09) :1567-&

[10]

LOHMANN AW, 1961, OPTIK, V18, P514

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