A NEW ION COUNTING SYSTEM DEVISED FOR MASS-SELECTIVE DETECTION OF SPUTTERED NEUTRALS IN LASER SNMS

被引:3
作者
ICHIMURA, S
GOTO, K
KOKUBUN, K
SHIMIZU, H
MATSUURA, S
机构
[1] HAMAMATSU PHOTON KK,TOYOOKA 43801,JAPAN
[2] NAGOYA INST TECHNOL,SHOWA KU,NAGOYA,AICHI 466,JAPAN
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 1990年 / 29卷 / 07期
关键词
Counting; Image processing; Laser; Postionization; Snms; Time of flight;
D O I
10.1143/JJAP.29.L1209
中图分类号
O59 [应用物理学];
学科分类号
摘要
A new ion counting system was devised for time-of-flight mass detection in sputtered neutral mass spectrometry (SNMS), using a pulse laser for postionization. A microchannel plate (MCP) intensifier used as a detector was gated by a retarding grid in front of the MCP for particular masses. High peak-counting ability (exceeding 1010 counts per second) of the system for ionization with a laser pulse (20–30 ns) was maintained for mass-selective detection. The performance of the new counting system at a high count rate was analyzed, and the detection limit and the accuracy were discussed. © 1990 The Japan Society of Applied Physics.
引用
收藏
页码:L1209 / L1212
页数:4
相关论文
共 8 条
[1]   ANALYSIS OF SOLIDS BY SECONDARY ION AND SPUTTERED NEUTRAL MASS-SPECTROMETRY [J].
GNASER, H ;
FLEISCHHAUER, J ;
HOFER, WO .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1985, 37 (04) :211-220
[2]   NEW COUNTING SYSTEM FOR DETECTION OF CHARGED-PARTICLES - APPLICATION TO IONS GENERATED BY A PULSED LASER-BEAM [J].
ICHIMURA, S ;
GOTO, K ;
KOKUBUN, K ;
SHIMIZU, H ;
HASHIZUME, H .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1990, 61 (04) :1192-1195
[3]   QUANTITATIVE DEPTH PROFILE AND BULK ANALYSIS WITH HIGH DYNAMIC-RANGE BY ELECTRON-GAS SPUTTERED NEUTRAL MASS-SPECTROMETRY [J].
JEDE, R ;
PETERS, H ;
DUNNEBIER, G ;
GANSCHOW, O ;
KAISER, U ;
SEIFERT, K .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (04) :2271-2279
[4]   DEPENDENCE OF THE NONRESONANT LASER IONIZATION OF RARE-GASES ON LASER WAVELENGTH [J].
KOKUBUN, K ;
ICHIMURA, S ;
HASHIZUME, H ;
SHIMIZU, H ;
OOWADANO, Y ;
MATSUMOTO, Y ;
ENDO, K .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1989, 28 (12) :L2271-L2272
[6]   SURFACE AND INTERFACE ANALYSIS BY NONRESONANT MULTIPHOTON IONIZATION OF SPUTTERED NEUTRALS [J].
PALLIX, JB ;
GILLEN, KT ;
BECKER, CH .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1988, 33 (1-4) :912-917
[7]   DETECTION OF SPUTTERED NEUTRAL ATOMS BY NONRESONANT MULTIPHOTON IONIZATION [J].
SHIMIZU, H ;
HASHIZUME, H ;
ICHIMURA, S ;
KOKUBUN, K .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1988, 27 (04) :L502-L505
[8]  
TUEMPNER J, 1987, J VAC SCI TECHNOL A, V5, P1186