Erosion Behavior of YAG Ceramics under Fluorine Plasma and their XPS Analysis

被引:22
作者
Kim, Kyeong-Beom [1 ]
Kim, Daemin [1 ]
Lee, Jungki [2 ]
Oh, Yoon-Suk [1 ]
Kim, Hyung-Tae [1 ]
Kim, Hyungsun [2 ]
Lee, Sung-Min [1 ]
机构
[1] Korea Inst Ceram Engn & Technol Icheon, Icheon 467843, Gyeonggi Do, South Korea
[2] Inha Univ, Sch Mat Engn, Incheon 402751, South Korea
关键词
YAG(Y3Al5O12); Plasma resistance; Erosion; X-ray photoelectron spectroscopy;
D O I
10.4191/KCERS.2009.46.5.456
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Chemical composition and status of chemical bonding of the YAG(Y3Al5O12) ceramics after the exposure to fluorine plasma have been investigated using X-ray photoelectron spectroscopy, with the analysis on its erosion behavior. On the surface, F showed the maximum content, decreasing with depth, meanwhile the cation composition remained almost constant, irrespective of the position. The peaks due to Y in the reaction layer consisted of two kinds, showing the Y-O and Y-F bonds. These surface modifications under fluorine plasma seem to promote the erosion of the YAG ceramics. Excess addition of Al2O3 or Y2O3 into stoichiometric YAG produced 2nd phases of Al2O3 and YAlO3, respectively, resulting in the slight difference in the local erosion rates. But, the overall average erosion rate was not sensitive to such excess additions of Al2O3 or Y2O3.
引用
收藏
页码:456 / 461
页数:6
相关论文
共 14 条
[1]   Plasma-resistant dense yttrium oxide film prepared by aerosol deposition process [J].
Iwasawa, Junichi ;
Nishimizu, Ryoichi ;
Tokita, Masahiro ;
Kiyohara, Masakatsu ;
Uematsu, Keizo .
JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 2007, 90 (08) :2327-2332
[2]   Effects of artificial pores and purity on the erosion behaviors of polycrystalline Al2O3 ceramics under fluorine plasma [J].
Kim, Dac-Min ;
Kim, Kyeong-Beom ;
Yoon, So-Young ;
Oh, Yoon-Suk ;
Kim, Hyung-Tae ;
Lee, Sung-Min .
JOURNAL OF THE CERAMIC SOCIETY OF JAPAN, 2009, 117 (1368) :863-867
[3]   Microstructural Changes of the Al2O3 Ceramics during the Exposure to Fluorine Plasma [J].
Kim, Dae Min ;
Lee, Sung-Min ;
Kim, Seong Won ;
Kim, Hyung Tae ;
Oh, Yoon-Suk .
JOURNAL OF THE KOREAN CERAMIC SOCIETY, 2008, 45 (07) :405-410
[4]   Plasma Resistances of Yttria Deposited by EB-PVD Method [J].
Kim, Dae-Min ;
Yoon, So-Young ;
Kim, Kyeong-Beom ;
Kim, Hui-Sik ;
Oh, Yoon-Suk ;
Lee, Sung-Min .
JOURNAL OF THE KOREAN CERAMIC SOCIETY, 2008, 45 (11) :707-712
[5]  
Kobayashi Y., 2006, USA Patent, Patent No. [US7,090,932, 7090932]
[6]   Evidence for the formation of SiON glasses [J].
Kohn, S ;
Hoffbauer, W ;
Jansen, M ;
Franke, R ;
Bender, S .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1998, 224 (03) :232-243
[7]  
May GS., 2006, FUNDAMENTALS SEMICON, P98, DOI [10.1002/0471790281, DOI 10.1002/0471790281]
[8]  
Miyazaki A., 2004, US Patent, Patent No. 6834613
[9]  
MORITA K, 2005, Patent No. 6933254
[10]  
Moulder J.F., 1995, HDB XRAY PHOTOELECTR, P10