CHANGE OF ENERGY-LEVEL DISTRIBUTION OF PHOTOEMISSION SOURCES IN AL AND ZN CAUSED BY SCRATCHING

被引：9
作者：
SHIGEKAWA, H
IWATSU, R
OKADA, M
HYODO, S
机构：
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1983年 / 22卷 / 01期
关键词：
D O I：
10.1143/JJAP.22.42
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
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页码：42 / 45
页数：4
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[4]   STORAGE EFFECT IN PHOTOSTIMULATED EXOELECTRON EMISSION FROM SCRATCHED ALUMINUM [J].
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[5]   DEFORMATION ENHANCED PHOTOEMISSION FROM ORIENTED ALUMINUM SINGLE-CRYSTAL SURFACES [J].
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