MEASUREMENT OF RF PROPERTIES OF MATERIALS A SURVEY

被引:140
作者
BUSSEY, HE
机构
来源
PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS | 1967年 / 55卷 / 06期
关键词
D O I
10.1109/PROC.1967.5719
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:1046 / +
页数:1
相关论文
共 73 条
[1]  
ALLEN JL, 1966, 12 ANN C MAGN MAGN M
[2]  
ALTSCHULER HM, 1963, HDB MICROWAVE MEASUR, P495
[3]  
ANDERSON JC, 1964, DIELECTRIC
[4]  
BAKER WP, 1965, ELECTRICAL INSULATIO
[6]  
BELL RO, 1961, IRE T MICROWAVE THEO, VMTT9, P239
[7]   MICROWAVE TECHNIQUES IN STUDY OF SEMICONDUCTORS [J].
BHAR, JN .
PROCEEDINGS OF THE IEEE, 1963, 51 (11) :1623-&
[8]   MEASUREMENT OF THE DIELECTRIC CONSTANT AND LOSS OF SOLIDS AND LIQUIDS BY A CAVITY PERTURBATION METHOD [J].
BIRNBAUM, G ;
FRANEAU, J .
JOURNAL OF APPLIED PHYSICS, 1949, 20 (08) :817-818
[9]   2-TERMINAL DIELECTRIC MEASUREMENTS UP TO 6X108 HZ [J].
BROADHURST, MG ;
BUR, AJ .
JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS SECTION C-ENGINEERING AND INSTRUMENTATION, 1965, C 69 (03) :165-+
[10]   MEASUREMENTS OF LARGE DIELECTRIC CONSTANTS AND LOSS TANGENTS AT 35 GC/S [J].
BURDICK, GA ;
LYON, TJ ;
PIPPIN, JE .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1964, IM13 (04) :318-&