STATISTICS OF DEEP-LEVEL AMPHOTERIC TRAPS IN INSULATORS AND AT INTERFACES

被引：12

作者：

WHITE, MH

CHAO, CC

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1985年 / 57卷 / 06期

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D O I：

10.1063/1.334334

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

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页码：2318 / 2321

页数：4

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