METHOD FOR PRODUCING LARGE SI FILMS FOR PRESELECTED IMPERFECTION ANALYSIS

被引:27
作者
LAWRENCE, JE
KOEHLER, H
机构
来源
JOURNAL OF SCIENTIFIC INSTRUMENTS | 1965年 / 42卷 / 04期
关键词
D O I
10.1088/0950-7671/42/4/322
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
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页码:270 / &
相关论文
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[3]   SAMPLE PREPARATION FOR TRANSMISSION ELECTRON MICROSCOPY OF GERMANIUM [J].
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