MEASUREMENT OF EMI SHIELDING OF PLASTIC COMPOSITES USING A DUAL CHAMBER FACILITY

被引:30
作者
BIGG, DM
MIRICK, W
STUTZ, DE
机构
[1] Battelle, Columbus Lab, Columbus,, OH, USA, Battelle, Columbus Lab, Columbus, OH, USA
关键词
DUAL CHAMBER FACILITY - ELECTROMAGNETIC INTERFERENCE - EMI SHIELDING;
D O I
10.1016/0142-9418(85)90036-4
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
引用
收藏
页码:169 / 181
页数:13
相关论文
共 5 条
  • [1] BODNAR DG, 1979, AMMRC TR7949
  • [2] BRADISH FW, 1982, SPE RETEC EMI RFI SH, V165
  • [3] BRADISH FW, 1976, SPI REINFORCED PLAST, V31, pD7
  • [4] STUTZ DE, 1981, 21 SO PROF PROGR SES
  • [5] White D. R. J., 1971, EMI EMC HDB SERIES, V4