THE DETERMINATION OF UNIT-CELL PARAMETERS FROM LAUE DIFFRACTION PATTERNS USING THEIR GNOMONIC PROJECTIONS

被引：21

作者：

CARR, PD ^{[1
]}

CRUICKSHANK, DWJ ^{[1
]}

HARDING, MM ^{[1
]}

机构：

[1] UNIV MANCHESTER,INST SCI & TECHNOL,DEPT CHEM,MANCHESTER M60 1QD,LANCS,ENGLAND

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1992年 / 25卷

关键词：

D O I：

10.1107/S0021889891012803

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

A method is described whereby the unit cell of a crystal and its orientation can be determined from a single Laue diffraction pattern (in transmission). The axial ratios and interaxial angles can be determined precisely, but the absolute scaling of the cell depends upon the accuracy with which the minimum wavelength for the experiment is known. Several examples are given.

引用

页码：294 / 308

页数：15

共 20 条

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[10] THE RECORDING AND ANALYSIS OF SYNCHROTRON X-RADIATION LAUE DIFFRACTION PHOTOGRAPHS [J].

HELLIWELL, JR ;

HABASH, J ;

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HARDING, MM ;

GREENHOUGH, TJ ;

CAMPBELL, JW ;

CLIFTON, IJ ;

ELDER, M ;

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JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1989, 22 :483-497

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