EVALUATION OF CMOS TIMER INTEGRATED-CIRCUITS FOR CRYOGENIC USE

被引：1

作者：

HARUYAMA, T ^{[1
]}

KIRSCHMAN, RK ^{[1
]}

机构：

[1] NATL LAB HIGH ENERGY PHYS,TSUKUBA,IBARAKI 305,JAPAN

来源：

CRYOGENICS | 1991年 / 31卷 / 12期

关键词：

LOW TEMPERATURE ELECTRONICS; CMOS; INSTRUMENTATION;

D O I：

10.1016/0011-2275(91)90128-J

中图分类号：

O414.1 [热力学];

学科分类号：

摘要：

'555' and '551' type CMOS timer integrated circuits have been evaluated for cryogenic use as resistor - capacitor (R - C) oscillators. First, the behaviour of 28 different integrated circuits (ICs) was compared between room and liquid nitrogen temperatures, under a variety of operating conditions. The behaviour of six of these ICs was then measured as a function of temperature over the range 80 - 320 K. All circuits operated reasonably well down to 80 K, with frequency variations within almost-equal-to +/- 2% at almost-equal-to 3 kHz. Tests on seven ICs at liquid helium temperature showed that they were not suitable for use at this temperature.

引用

页码：1055 / 1064

页数：10

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