EVALUATION OF CMOS TIMER INTEGRATED-CIRCUITS FOR CRYOGENIC USE

被引：1
|
作者：
HARUYAMA, T [1 ]
KIRSCHMAN, RK [1 ]
机构：
[1] NATL LAB HIGH ENERGY PHYS,TSUKUBA,IBARAKI 305,JAPAN
来源：
CRYOGENICS | 1991年 / 31卷 / 12期
关键词：
LOW TEMPERATURE ELECTRONICS; CMOS; INSTRUMENTATION;
D O I：
10.1016/0011-2275(91)90128-J
中图分类号：
O414.1 [热力学];
学科分类号：
摘要：
'555' and '551' type CMOS timer integrated circuits have been evaluated for cryogenic use as resistor - capacitor (R - C) oscillators. First, the behaviour of 28 different integrated circuits (ICs) was compared between room and liquid nitrogen temperatures, under a variety of operating conditions. The behaviour of six of these ICs was then measured as a function of temperature over the range 80 - 320 K. All circuits operated reasonably well down to 80 K, with frequency variations within almost-equal-to +/- 2% at almost-equal-to 3 kHz. Tests on seven ICs at liquid helium temperature showed that they were not suitable for use at this temperature.
引用
收藏
页码：1055 / 1064
页数：10
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