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DEEP UV LITHOGRAPHY
被引:176
作者
:
LIN, BJ
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
LIN, BJ
[
1
]
机构
:
[1]
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
来源
:
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY
|
1975年
/ 12卷
/ 06期
关键词
:
D O I
:
10.1116/1.568527
中图分类号
:
O59 [应用物理学];
学科分类号
:
摘要
:
引用
收藏
页码:1317 / 1320
页数:4
相关论文
共 8 条
[1]
VACUUM ULTRAVIOLET HOLOGRAPHY
BJORKLUND, GC
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV, MICROWAVE LAB, STANFORD, CA 94305 USA
STANFORD UNIV, MICROWAVE LAB, STANFORD, CA 94305 USA
BJORKLUND, GC
HARRIS, SE
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV, MICROWAVE LAB, STANFORD, CA 94305 USA
STANFORD UNIV, MICROWAVE LAB, STANFORD, CA 94305 USA
HARRIS, SE
YOUNG, JF
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV, MICROWAVE LAB, STANFORD, CA 94305 USA
STANFORD UNIV, MICROWAVE LAB, STANFORD, CA 94305 USA
YOUNG, JF
[J].
APPLIED PHYSICS LETTERS,
1974,
25
(08)
: 451
-
452
[2]
CHARACTERIZATION OF POSITIVE PHOTORESIST
DILL, FH
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HEIGHTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HEIGHTS,NY 10598
DILL, FH
HORNBERGER, WP
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HEIGHTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HEIGHTS,NY 10598
HORNBERGER, WP
HAUGE, PS
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HEIGHTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HEIGHTS,NY 10598
HAUGE, PS
SHAW, JM
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HEIGHTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HEIGHTS,NY 10598
SHAW, JM
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1975,
ED22
(07)
: 445
-
452
[3]
REPLICATION OF 0.1-MUM GEOMETRIES WITH X-RAY LITHOGRAPHY
FEDER, R
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
FEDER, R
SPILLER, E
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
SPILLER, E
TOPALIAN, J
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
TOPALIAN, J
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY,
1975,
12
(06):
: 1332
-
1335
[4]
Hass G., 1972, AIP HDB
[5]
ELECTRON RESISTS FOR MICROCIRCUIT AND MASK PRODUCTION
HATZAKIS, M
论文数:
0
引用数:
0
h-index:
0
机构:
International Business Machines Corporation, Thomas J. Watson Research Center, New York, Yorktown Heights
HATZAKIS, M
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1969,
116
(07)
: 1033
-
&
[6]
MOREAU WM, 1970, 1038TH EL SOC M
[7]
FABRICATION TECHNIQUES FOR SURFACE-ACOUSTIC-WAVE AND THIN-FILM OPTICAL DEVICES
SMITH, HI
论文数:
0
引用数:
0
h-index:
0
机构:
MIT, LINCOLN LAB, LEXINGTON, MA 02173 USA
MIT, LINCOLN LAB, LEXINGTON, MA 02173 USA
SMITH, HI
[J].
PROCEEDINGS OF THE IEEE,
1974,
62
(10)
: 1361
-
1387
[8]
PHOTOLITHOGRAPHIC CONTACT PRINTING OF 4000A LINEWIDTH PATTERNS
SMITH, HI
论文数:
0
引用数:
0
h-index:
0
机构:
MIT, LINCOLN LAB, LEXINGTON, MA 02173 USA
MIT, LINCOLN LAB, LEXINGTON, MA 02173 USA
SMITH, HI
EFREMOW, N
论文数:
0
引用数:
0
h-index:
0
机构:
MIT, LINCOLN LAB, LEXINGTON, MA 02173 USA
MIT, LINCOLN LAB, LEXINGTON, MA 02173 USA
EFREMOW, N
KELLEY, PL
论文数:
0
引用数:
0
h-index:
0
机构:
MIT, LINCOLN LAB, LEXINGTON, MA 02173 USA
MIT, LINCOLN LAB, LEXINGTON, MA 02173 USA
KELLEY, PL
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1974,
121
(11)
: 1503
-
1506
←
1
→
共 8 条
[1]
VACUUM ULTRAVIOLET HOLOGRAPHY
BJORKLUND, GC
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV, MICROWAVE LAB, STANFORD, CA 94305 USA
STANFORD UNIV, MICROWAVE LAB, STANFORD, CA 94305 USA
BJORKLUND, GC
HARRIS, SE
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV, MICROWAVE LAB, STANFORD, CA 94305 USA
STANFORD UNIV, MICROWAVE LAB, STANFORD, CA 94305 USA
HARRIS, SE
YOUNG, JF
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV, MICROWAVE LAB, STANFORD, CA 94305 USA
STANFORD UNIV, MICROWAVE LAB, STANFORD, CA 94305 USA
YOUNG, JF
[J].
APPLIED PHYSICS LETTERS,
1974,
25
(08)
: 451
-
452
[2]
CHARACTERIZATION OF POSITIVE PHOTORESIST
DILL, FH
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HEIGHTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HEIGHTS,NY 10598
DILL, FH
HORNBERGER, WP
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HEIGHTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HEIGHTS,NY 10598
HORNBERGER, WP
HAUGE, PS
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HEIGHTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HEIGHTS,NY 10598
HAUGE, PS
SHAW, JM
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HEIGHTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HEIGHTS,NY 10598
SHAW, JM
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1975,
ED22
(07)
: 445
-
452
[3]
REPLICATION OF 0.1-MUM GEOMETRIES WITH X-RAY LITHOGRAPHY
FEDER, R
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
FEDER, R
SPILLER, E
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
SPILLER, E
TOPALIAN, J
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
TOPALIAN, J
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY,
1975,
12
(06):
: 1332
-
1335
[4]
Hass G., 1972, AIP HDB
[5]
ELECTRON RESISTS FOR MICROCIRCUIT AND MASK PRODUCTION
HATZAKIS, M
论文数:
0
引用数:
0
h-index:
0
机构:
International Business Machines Corporation, Thomas J. Watson Research Center, New York, Yorktown Heights
HATZAKIS, M
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1969,
116
(07)
: 1033
-
&
[6]
MOREAU WM, 1970, 1038TH EL SOC M
[7]
FABRICATION TECHNIQUES FOR SURFACE-ACOUSTIC-WAVE AND THIN-FILM OPTICAL DEVICES
SMITH, HI
论文数:
0
引用数:
0
h-index:
0
机构:
MIT, LINCOLN LAB, LEXINGTON, MA 02173 USA
MIT, LINCOLN LAB, LEXINGTON, MA 02173 USA
SMITH, HI
[J].
PROCEEDINGS OF THE IEEE,
1974,
62
(10)
: 1361
-
1387
[8]
PHOTOLITHOGRAPHIC CONTACT PRINTING OF 4000A LINEWIDTH PATTERNS
SMITH, HI
论文数:
0
引用数:
0
h-index:
0
机构:
MIT, LINCOLN LAB, LEXINGTON, MA 02173 USA
MIT, LINCOLN LAB, LEXINGTON, MA 02173 USA
SMITH, HI
EFREMOW, N
论文数:
0
引用数:
0
h-index:
0
机构:
MIT, LINCOLN LAB, LEXINGTON, MA 02173 USA
MIT, LINCOLN LAB, LEXINGTON, MA 02173 USA
EFREMOW, N
KELLEY, PL
论文数:
0
引用数:
0
h-index:
0
机构:
MIT, LINCOLN LAB, LEXINGTON, MA 02173 USA
MIT, LINCOLN LAB, LEXINGTON, MA 02173 USA
KELLEY, PL
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1974,
121
(11)
: 1503
-
1506
←
1
→