A NEWLY DEVELOPED HIGH-RESOLUTION HOT STAGE AND ITS APPLICATION TO MATERIALS CHARACTERIZATION

被引：84

作者：

KAMINO, T

SAKA, H

机构：

来源：

MICROSCOPY MICROANALYSIS MICROSTRUCTURES | 1993年 / 4卷 / 2-3期

关键词：

D O I：

10.1051/mmm:0199300402-3012700

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

This paper describes the newly developed specimen hot stage and its applications. The hot stage is designed for high resolution TEM image observation at high temperatures and EDX analysis at room temperature. A fine metal wire is employed as the heating element of the stage and battery is used as the heating power source. The hot stage is particularly useful for particle specimens. By using this novel stage, a HREM observation of Si at high temperatures (approximately 1400-degrees-C) has been carried out. A dynamical observation of the surface of a PbTiO3 particle during heating and its chemical analysis using EDX before and after heating are also carried out.

引用

页码：127 / 135

页数：9