EXTENDED RANGE FIELD-EMISSION SPECTROSCOPY

被引：10

作者：

ISAACSON, M

GOMER, R

机构：

[1] UNIV CHICAGO,DEPT CHEM,CHICAGO,IL 60637

[2] UNIV CHICAGO,ENRICO FERMI INST,CHICAGO,IL 60637

[3] UNIV CHICAGO,JAMES FRANCK INST,CHICAGO,IL 60637

来源：

APPLIED PHYSICS | 1978年 / 15卷 / 03期

关键词：

D O I：

10.1007/BF00896104

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：253 / 256

页数：4

共 8 条

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ISAACSON, M ;

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[2] HIGH RESOLUTION ELECTRON SPECTROMETER FOR USE IN TRANSMISSION SCANNING ELECTRON MICROSCOPY [J].

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ISAACSON, M ;

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[3] FIELD-EMISSION ENERGY-DISTRIBUTION (FEED) [J].

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PLUMMER, EW .

REVIEWS OF MODERN PHYSICS, 1973, 45 (03) :487-548

[4]

GOMER R, 1974, ADV CHEM PHYS, V27, P211

[5] FIELD-EMISSION DEFLECTION ENERGY ANALYZER [J].

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PLUMMER, EW .

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[6] ENERGY-DISTRIBUTIONS OF FIELD EMITTED ELECTRONS FROM TUNGSTEN IN PRESENCE OF ADSORBED CO [J].

YOUNG, PL ;

GOMER, R .

JOURNAL OF CHEMICAL PHYSICS, 1974, 61 (12) :4955-4972

[7] EFFECT OF SURFACE PATCH FIELDS ON FIELD-EMISSION WORK-FUNCTION DETERMINATIONS [J].

YOUNG, RD ;

CLARK, HE .

PHYSICAL REVIEW LETTERS, 1966, 17 (07) :351-&

[8] RESOLUTION DETERMINATION IN FIELD EMISSION ENERGY ANALYZERS [J].

YOUNG, RD ;

KUYATT, CE .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1968, 39 (10) :1477-&

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