INFLUENCE OF TUNNEL GENERATION PROCESSES ON THE RELAXATION OF THE CAPACITANCE OF METAL-INSULATOR SEMICONDUCTOR STRUCTURES

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作者
VYUKOV, LA
SURIS, RA
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SOVIET PHYSICS SEMICONDUCTORS-USSR | 1982年 / 16卷 / 10期
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O469 [凝聚态物理学];
学科分类号
070205 ;
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页码:1134 / 1137
页数:4
相关论文
共 11 条
[1]  
ABDUVAKHIDOV KM, 1976, SOV PHYS SEMICOND+, V10, P242
[2]   TUNNEL CURRENT LIMITATIONS OF NARROW BANDGAP IR CHARGE COUPLED DEVICES [J].
ANDERSON, WW .
INFRARED PHYSICS, 1977, 17 (02) :147-164
[3]  
RZHANOV AV, 1976, PROPERTIES OF MIS ST, P71
[4]  
SEQUIN CH, 1975, ADV ELECTRON ELECT S, V8
[5]   FULLY MONOLITHIC INSB INFRARED CCD ARRAY [J].
THOM, RD ;
KOCH, TL ;
LANGAN, JD ;
PARRISH, WJ .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1980, 27 (01) :160-170
[6]  
Timashev S. F., 1972, Soviet Physics - Solid State, V14, P136
[7]  
TIMASHEV SF, 1974, SOV PHYS SEMICOND+, V8, P517
[8]  
TIMASHEV SF, 1974, SOV PHYS SEMICOND, V7, P1204
[9]  
TIMASHEY SF, 1973, SOV PHYS SEMICOND+, V7, P94
[10]  
Vyukov L. A., 1980, MIKROELEKTRONIKA, V9, P107