ESCA MEASUREMENTS ON NI-CR THIN-FILM RESISTORS

被引：0

作者：

POLASCHEGG, HD

HEINZ, B

SOMMERKAMP, P

机构：

[1] FA LEYBOLD HERAEUS, COLOGNE, FED REP GER

[2] FA LEYBOLD HERAEUS, HANAU, FED REP GER

来源：

VAKUUM-TECHNIK | 1976年 / 25卷 / 01期

关键词：

D O I：

暂无

中图分类号：

TH [机械、仪表工业];

学科分类号：

0802 ;

摘要：

引用

页码：12 / 16

页数：5

共 10 条

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[6] SPHERICAL ANALYZER WITH PRE-RETARDATION [J].

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POLASCHEGG HD, 1975, VAKUUM-TECH, V24, P136

[8]

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[9] SENSITIVITY OF DETECTION OF ELEMENTS BY PHOTOELECTRON SPECTROMETRY [J].

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ANALYTICAL CHEMISTRY, 1972, 44 (06) :1050-&

[10]

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