TEMPERATURE-DEPENDENCE OF FERROMAGNETIC-RESONANCE LINEWIDTH IN PURE AND SUBSTITUTED BARIUM FERRITE

被引：14

作者：

SILBER, LM

TSANTES, E

WILBER, WD

机构：

[1] US Army Electronics Technology &, Devices Lab, Fort Monmouth, NJ, USA, US Army Electronics Technology & Devices Lab, Fort Monmouth, NJ, USA

来源：

JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | 1986年 / 54-7卷

关键词：

BARIUM FERRITE - FERROMAGNETIC RESONANCE - TEMPERATURE DEPENDENCE;

D O I：

10.1016/0304-8853(86)90754-7

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：1141 / 1142

页数：2

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[6]

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