共 50 条
[21]
MEASUREMENT OF MINORITY-CARRIER TRANSPORT PARAMETERS IN HEAVILY DOPED n-TYPE SILICON.
[J].
1600, (ED-32)
[22]
MINORITY-CARRIER INJECTION INTO SEMICONDUCTORS
[J].
PHYSICAL REVIEW B,
1978, 17 (06)
:2640-2647
[26]
DETECTION OF MINORITY-CARRIER TRAPS IN SEMICONDUCTORS
[J].
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH,
1980, 62 (02)
:539-545
[27]
MINORITY-CARRIER LIFETIME IN POLYCRYSTALLINE SEMICONDUCTORS
[J].
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH,
1983, 77 (02)
:467-470
[29]
MINORITY-CARRIER INJECTION IN RELAXATION SEMICONDUCTORS
[J].
PHYSICAL REVIEW B,
1975, 11 (04)
:1563-1568