ONE MICRON SPATIAL-RESOLUTION WITH SILICON STRIP DETECTORS

被引:27
作者
STRAVER, J
TOKER, O
WEILHAMMER, P
COLLEDANI, C
DULINSKI, W
TURCHETTA, R
BOSISIO, L
机构
[1] LEPSI,STRASBOURG,FRANCE
[2] CERN,CH-1211 GENEVA 23,SWITZERLAND
[3] INFN,TRIESTE,ITALY
[4] UNIV TRIESTE,I-34127 TRIESTE,ITALY
关键词
D O I
10.1016/0168-9002(94)90785-4
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
We have tested two 25 mum pitch DC-coupled p-side silicon microstrip detectors with low noise VIKING readout, in a 100 GeV pi-beam at CERN. Two independent analyses, using the same data set, obtained the following results: The signal to single channel noise ratio was 71 to 1 (75 to 1), and the spatial resolution was measured to be sigma = 1.25 mum (sigma = 1.30 mum) for tracks perpendicular to the surface.
引用
收藏
页码:485 / 490
页数:6
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