ONE MICRON SPATIAL-RESOLUTION WITH SILICON STRIP DETECTORS

被引：26

作者：

STRAVER, J

TOKER, O

WEILHAMMER, P

COLLEDANI, C

DULINSKI, W

TURCHETTA, R

BOSISIO, L

机构：

[1] LEPSI,STRASBOURG,FRANCE

[2] CERN,CH-1211 GENEVA 23,SWITZERLAND

[3] INFN,TRIESTE,ITALY

[4] UNIV TRIESTE,I-34127 TRIESTE,ITALY

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1994年 / 348卷 / 2-3期

关键词：

D O I：

10.1016/0168-9002(94)90785-4

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We have tested two 25 mum pitch DC-coupled p-side silicon microstrip detectors with low noise VIKING readout, in a 100 GeV pi-beam at CERN. Two independent analyses, using the same data set, obtained the following results: The signal to single channel noise ratio was 71 to 1 (75 to 1), and the spatial resolution was measured to be sigma = 1.25 mum (sigma = 1.30 mum) for tracks perpendicular to the surface.

引用

页码：485 / 490

页数：6

共 14 条

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