TRACE DETERMINATION OF CARBON AND OXYGEN IN TUNGSTEN BY SPARK-SOURCE MASS-SPECTROGRAPHY

[1] BESKE HE, 1973, Z ANAL CHEM, V267, P99

[2] BEY PP, 1968, NRL6655 NAV RES LAB

[3] DETERMINATION OF OXYGEN IN SEMICONDUCTOR MATERIALS WITH A CRYOGENICALLY PUMPED SPARK-SOURCE MASS-SPECTROMETER [J]. ANALYST, 1973, 98 (1162) : 69 - 74

[4] CLEGG JB, 1975, PHILIPS TECH REV, V34, P344

[5] CUKOR P, 1975, TALANTA, V22, P571, DOI 10.1016/0039-9140(75)80024-5

[6] DESJARDINS M, 1968, ADV MASS SPECTROM, V4, P439

[7] QUANTITATIVE SPARK SOURCE MASS SPECTROMETRY USING CRYOSORPTION PUMPING [J]. ANALYTICAL CHEMISTRY, 1965, 37 (12) : 1480 - +

[8] DETERMINATION OF TRACE AMOUNTS OF CARBON OXYGEN AND NITROGEN IN METALS BY SPARK SOURCE MASS SPECTROMETRY [J]. ANALYTICAL CHEMISTRY, 1966, 38 (07) : 821 - +

[9] MASS SPECTROGRAPH FOR ANALYSIS OF SOLIDS [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1963, 34 (07) : 783 - &

[10] KONISHI F, 1971, ADV MASS SPECTROMETR, V2, P547

[1] BESKE HE, 1973, Z ANAL CHEM, V267, P99

[2] BEY PP, 1968, NRL6655 NAV RES LAB

[3] DETERMINATION OF OXYGEN IN SEMICONDUCTOR MATERIALS WITH A CRYOGENICALLY PUMPED SPARK-SOURCE MASS-SPECTROMETER [J]. ANALYST, 1973, 98 (1162) : 69 - 74

[4] CLEGG JB, 1975, PHILIPS TECH REV, V34, P344

[5] CUKOR P, 1975, TALANTA, V22, P571, DOI 10.1016/0039-9140(75)80024-5

[6] DESJARDINS M, 1968, ADV MASS SPECTROM, V4, P439

[7] QUANTITATIVE SPARK SOURCE MASS SPECTROMETRY USING CRYOSORPTION PUMPING [J]. ANALYTICAL CHEMISTRY, 1965, 37 (12) : 1480 - +

[8] DETERMINATION OF TRACE AMOUNTS OF CARBON OXYGEN AND NITROGEN IN METALS BY SPARK SOURCE MASS SPECTROMETRY [J]. ANALYTICAL CHEMISTRY, 1966, 38 (07) : 821 - +

[9] MASS SPECTROGRAPH FOR ANALYSIS OF SOLIDS [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1963, 34 (07) : 783 - &

[10] KONISHI F, 1971, ADV MASS SPECTROMETR, V2, P547