MOLECULAR-BEAM EPITAXIAL-GROWTH OF PULSE-DOPED PSEUDOMORPHIC GAALAS GAINAS TRANSISTORS WITH HIGH-GAIN AND LOW-NOISE PROPERTIES

被引:10
作者
HOKE, WE
LYMAN, PS
LABOSSIER, WH
HUANG, JC
ZAITLIN, M
HENDRIKS, H
FLYNN, G
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1990年 / 8卷 / 03期
关键词
D O I
10.1116/1.585033
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:397 / 401
页数:5
相关论文
共 14 条
[1]  
ENGAN GF, 1979, IEEE T MICROWAVE THE, P987
[2]   CURRENT-GAIN CUTOFF FREQUENCY COMPARISON OF INGAAS HEMTS [J].
HIKOSAKA, K ;
SASA, S ;
HARADA, N ;
KURODA, S .
IEEE ELECTRON DEVICE LETTERS, 1988, 9 (05) :241-243
[3]   BEHAVIOR AND CHARACTERISTICS OF RADIATIONALLY HEATED GAAS SUBSTRATES [J].
HOKE, WE ;
LYMAN, PS ;
LABOSSIER, WH .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1987, 5 (03) :734-738
[5]   HIGH TRANSCONDUCTANCE INGAAS/ALGAAS PSEUDOMORPHIC MODULATION-DOPED FIELD-EFFECT TRANSISTORS [J].
KETTERSON, A ;
MOLONEY, M ;
MASSELINK, WT ;
PENG, CK ;
KLEM, J ;
FISCHER, R ;
KOPP, W ;
MORKOC, H .
IEEE ELECTRON DEVICE LETTERS, 1985, 6 (12) :628-630
[6]  
LINH N, 1987, SEMICONDUCT SEMIMET, V24, P224
[7]   A NEW FIELD-EFFECT TRANSISTOR WITH SELECTIVELY DOPED GAAS-N-ALXGA1-XAS HETEROJUNCTIONS [J].
MIMURA, T ;
HIYAMIZU, S ;
FUJII, T ;
NANBU, K .
JAPANESE JOURNAL OF APPLIED PHYSICS, 1980, 19 (05) :L225-L227
[8]   CHARGE CONTROL, DC, AND RF PERFORMANCE OF A 0.35-MU-M PSEUDOMORPHIC ALGAAS/INGAAS MODULATION-DOPED FIELD-EFFECT TRANSISTOR [J].
NGUYEN, LD ;
SCHAFF, WJ ;
TASKER, PJ ;
LEPORE, AN ;
PALMATEER, LF ;
FOISY, MC ;
EASTMAN, LF .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1988, 35 (02) :139-144
[9]   INFLUENCE OF SUBSTRATE-TEMPERATURE AND INAS MOLE FRACTION ON THE INCORPORATION OF INDIUM DURING MOLECULAR-BEAM EPITAXIAL-GROWTH OF INGAAS SINGLE QUANTUM WELLS ON GAAS [J].
RADULESCU, DC ;
SCHAFF, WJ ;
EASTMAN, LF ;
BALLINGALL, JM ;
RAMSEYER, GO ;
HERSEE, SD .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1989, 7 (01) :111-115
[10]   AN IN0.15GA0.85 AS/GAAS PSEUDOMORPHIC SINGLE QUANTUM WELL HEMT [J].
ROSENBERG, JJ ;
BENLAMRI, M ;
KIRCHNER, PD ;
WOODALL, JM ;
PETTIT, GD .
IEEE ELECTRON DEVICE LETTERS, 1985, 6 (10) :491-493