NONDESTRUCTIVE ANALYSIS OF THIN ZNXCD1-XS FILMS BY RUTHERFORD BACKSCATTERING AND OPTICAL MEASUREMENTS

被引：1

作者：

REINSPERGER, GU ^{[1
]}

SCHWABE, F ^{[1
]}

SELLE, B ^{[1
]}

机构：

[1] FRIEDRICH SCHILLER UNIV,SEKT PHYS,BEREICH IONOMETRIE,DDR-6900 JENA,GER DEM REP

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1985年 / 88卷 / 02期

关键词：

D O I：

10.1002/pssa.2210880242

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：745 / 751

页数：7

共 19 条

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