共 50 条
- [21] Mechanism for secondary electron dopant contrast in the SEM JOURNAL OF ELECTRON MICROSCOPY, 2000, 49 (02): : 311 - 321
- [22] Influence of dopant species on electron mobility in heavily doped semiconductors Materials Science Forum, 1997, 258-263 (pt 2): : 939 - 944
- [24] DENSITY OF ELECTRON-STATES IN SEMICONDUCTORS WITH A PERIODIC DOPANT DISTRIBUTION SOVIET PHYSICS SEMICONDUCTORS-USSR, 1975, 9 (12): : 1506 - 1510
- [25] Influence of dopant species on electron mobility in heavily doped semiconductors DEFECTS IN SEMICONDUCTORS - ICDS-19, PTS 1-3, 1997, 258-2 : 939 - 944
- [27] Scanning capacitance microscopy applied to two-dimensional dopant profiling of semiconductors MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1997, 44 (1-3): : 46 - 51
- [28] ELECTRON-BEAM DEPTH PROFILING IN SEMICONDUCTORS JOURNAL OF MICROSCOPY-OXFORD, 1980, 118 (MAR): : 291 - 296
- [30] Dopant regions imaging in scanning electron microscopy Journal of Applied Physics, 1600, 99 (04):